Cp/Cpk and Statistical process control for offset

dimitri

Well-known member
Hello all,

I was wondering if anyone has Statistical Process Control practices in place at your facility. More specific, I was wondering if anyone has calculated the Cp and Cpk metrics for density and/or dot gain from different production runs, over different presses and different stocks.

In most manufacturing environments, a Cp value below 1.00 would indicate that the process is out of control. Would you consider this benchmark value to hold true for offset applications?

If you are willing to share, what would be a target Cp value and what would you consider as realistic goals in trying to reduce density and dot gain variation from production run to production run.

Thank you,
-Dimitri
 

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